Technical Biography: Dr. Thomas W. Williams is a retired Synopsys Fellow at Synopsys in Canmore, Alberta Canada. Formerly, he was with IBM Microelectronics Division and manager of the VLSI Design for Testability group. He received a B.S.E.E. from Clarkson University, an M.A. in pure mathematics from the State University of New York at Binghamton, and a Ph.D. in electrical engineering from Colorado State University. He has received numerous best paper awards from the IEEE and ACM, is the founder or co-founder of a number of workshops and conferences dealing with testing, and was twice a Distinguished Visitor lecturer for the IEEE Computer Society. Dr. Williams has previously served on the Computer Society Board of Governors and the IEEE Board of Directors, and was the Society's 2000 Treasurer. He is a member of the Eta Kappa Nu, Tau Beta Pi, IEEE, ACM, Sigma Xi, and Phi Kappa Phi. He is an Adjunct Professor at the University of Calgary, Calgary, Alberta, Canada; and in 1985 and 1997, he was a Guest Professor and Robert Bosch Fellow at the Universitaet of Hannover, Hannover, Germany. He was recently honored as a foreign member of the Chinese Academy of Science. Dr. Williams was named an IEEE Fellow in 1988 and received the Computer Society's W. Wallace McDowell Award for outstanding contributions to the computer art in 1989. In 2007 Dr. Williams received the European Design and Automation Association Lifetime Achievement Award for "outstanding contributions to the state of the art in electronic design, automation, and testing of electronic systems." In 2010 Dr. Williams received the Distinguished Alumni Award Colorado State University, College of Engineering. That same year he also received the IEEE TTTC Lifetime Contribution Medal. In 2018 he received the Phil Kaufman Award, “The Nobel Prize” of Semiconductor Industry, “Dr. Williams is being honored for his overall impact on the electronics industry through contributions to scan Design for Testability and related test automation.” In 2019 Dr. Edward B. Eichelberger and Dr. Williams received the 2019 ACM/IEEE A. Richard Newton Technical Impact Award in Electronic Design Automation for their paper: E. B. Eichelberger and T. W. Williams, “A Logic Design Structure for LSI Testability,” In Proc. of the 14th Design Automation Conference, 1977.Dr. Williams is listed in Who’s Who in Science and Engineering, Who’s Who in America and Who’s Who in the World.
Photo Biography: Tom Williams was born in Rochester New York, the home of Eastman Kodak. From his mother he learned the joys of the Eastman House and from his father, who worked at Wollensak Optical and then in 1948 went to work at Eastman Kodak Company, he learned the love and joys of photography. He has done extensive photography during his business travels, see below. Now retired he devotes full time to photography. He has had a one man show in Boulder, Colorado USA and had numerous occasions to do sun rise and set at Stonehenge in the UK, with the permission of the English Heritage. His current passion is wild animals and birds.
Thomas W. Williams
From his mother he learned the joys of the Eastman House and from his father, who worked at Wollensak Optical and then in 1948 went to work at Eastman Kodak Company, he learned the love and joys of photography. He has done extensive photography during his business travels, see below. Now retired he devotes full time to photography. He has had a one man show in Boulder, Colorado USA and had numerous occasions to do sun rise and set at Stonehenge in the UK, with the permission of the English Heritage. His current passion is wild animals and birds.
Technical Biography:
Dr. Thomas W. Williams is a retired Synopsys Fellow at Synopsys in Canmore, Alberta Canada. Formerly, he was with IBM Microelectronics Division and manager of the VLSI Design for Testability group. He received a B.S.E.E. from Clarkson University, an M.A. in pure mathematics from the State University of New York at Binghamton, and a Ph.D. in electrical engineering from Colorado State University. He has received numerous best paper awards from the IEEE and ACM, is the founder or co-founder of a number of workshops and conferences dealing with testing, and was twice a Distinguished Visitor lecturer for the IEEE Computer Society. Dr. Williams has previously served on the Computer Society Board of Governors and the IEEE Board of Directors, and was the Society's 2000 Treasurer. He is a member of the Eta Kappa Nu, Tau Beta Pi, IEEE, ACM, Sigma Xi, and Phi Kappa Phi. He is an Adjunct Professor at the University of Calgary, Calgary, Alberta, Canada; and in 1985 and 1997, he was a Guest Professor and Robert Bosch Fellow at the Universitaet of Hannover, Hannover, Germany. He was recently honored as a foreign member of the Chinese Academy of Science. Dr. Williams was named an IEEE Fellow in 1988 and received the Computer Society's W. Wallace McDowell Award for outstanding contributions to the computer art in 1989. In 2007 Dr. Williams received the European Design and Automation Association Lifetime Achievement Award for "outstanding contributions to the state of the art in electronic design, automation, and testing of electronic systems." In 2010 Dr. Williams received the Distinguished Alumni Award Colorado State University, College of Engineering. That same year he also received the IEEE TTTC Lifetime Contribution Medal. In 2018 he received the Phil Kaufman Award, “The Nobel Prize” of Semiconductor Industry, “Dr. Williams is being honored for his overall impact on the electronics industry through contributions to scan Design for Testability and related test automation.” In 2019 Dr. Edward B. Eichelberger and Dr. Williams received the 2019 ACM/IEEE A. Richard Newton Technical Impact Award in Electronic Design Automation for their paper: E. B. Eichelberger and T. W. Williams, “A Logic Design Structure for LSI Testability,” In Proc. of the 14th Design Automation Conference, 1977. Dr. Williams is listed in Who’s Who in Science and Engineering, Who’s Who in America and Who’s Who in the World.